@incollection {eisele_03_approach, title = {A new approach for defect detection in X-ray CT images}, volume = {2449}, year = {2003}, pages = {345-352}, publisher = {Springer}, doi = {10.1007/3-540-45783-6}, author = {H. Eisele and Fred A. Hamprecht}, editor = {Luc Van Gool} }