@incollection {eisele_03_approach,
	title = {A new approach for defect detection in X-ray CT images},
	volume = {2449},
	year = {2003},
	pages = {345-352},
	publisher = {Springer},
	doi = {10.1007/3-540-45783-6},
	author = {H. Eisele and Fred A. Hamprecht},
	editor = {Luc Van Gool}
}
