@article {goerlitz_09_allocation,
	title = {Allocation of particles to development processes},
	journal = {Patent},
	year = {2009},
	author = {G{\"o}rlitz, L. and Fred A. Hamprecht and Staudacher, M.}
}
@article {staudacher_09_selbstadaptivitaet,
	title = {Self Adjustment of Scanning Electron Microscopes / Selbstadaptivit{\"a}t von Rasterelektronenmikroskopen},
	journal = {Patent, Patent Number  WO2009062781A1},
	year = {2009},
	author = {Staudacher, M. and Fred A. Hamprecht and G{\"o}rlitz, L.}
}
@article {staudacher_08_method,
	title = {Method for processing an intensity image of a microscope},
	journal = {Patent, Patent Number: WO2008034721A1},
	year = {2008},
	author = {Staudacher, M. and Fred A. Hamprecht and G{\"o}rlitz, L.}
}
@booklet {goerlitz_05_detektion,
	title = {Detektion von Partikeln in Intensit{\"a}tsbildern mit Hilfe eines morphologischen Skalenraumes},
	year = {2005},
	publisher = {Robert-Bosch GmbH, University of Heidelberg},
	author = {G{\"o}rlitz, L. and Fred A. Hamprecht and Staudacher, M.}
}
@booklet {strobel_05_verfahren,
	title = {Verfahren und Pr{\"u}fk{\"o}rper zur Bestimmung der Reinigungswirkung in einem Ultraschallbild},
	year = {2005},
	author = {Strobel, J. and G{\"o}rlitz, L. and Staudacher, M.}
}
