Sanakoyeu, A, Ma, P, Tschernezki, V and Ommer, B (2021). Improving Deep Metric Learning by Divide and Conquer. IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI). https://arxiv.org/abs/2109.04003

 Kotovenko, D, Sanakoyeu, A, Lang, S and Ommer, B (2019). Content and Style Disentanglement for Artistic Style Transfer. Proceedings of the Intl. Conf. on Computer Vision (ICCV)