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 Sanakoyeu, A, Ma, P, Tschernezki, V and Ommer, B (2021). Improving Deep Metric Learning by Divide and Conquer. IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI). https://arxiv.org/abs/2109.04003\par \par  Sanakoyeu, A, Tschernezki, V, B\'fcchler, U and Ommer, B (2019). Divide and Conquer the Embedding Space for Metric Learning.  Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). https://github.com/CompVis/metric-learning-divide-and-conquer\par \par }