<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>13</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">H. Eisele</style></author><author><style face="normal" font="default" size="100%">Fred A. Hamprecht</style></author></authors><secondary-authors><author><style face="normal" font="default" size="100%">Luc Van Gool</style></author></secondary-authors></contributors><titles><title><style face="normal" font="default" size="100%">A new approach for defect detection in X-ray CT images</style></title><secondary-title><style face="normal" font="default" size="100%">Pattern Recognition</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2003</style></year></dates><publisher><style face="normal" font="default" size="100%">Springer</style></publisher><volume><style face="normal" font="default" size="100%">2449</style></volume><pages><style face="normal" font="default" size="100%">345-352</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><custom3><style face="normal" font="default" size="100%">Lecture notes in computer science</style></custom3></record></records></xml>