<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Scheuermann, T.</style></author><author><style face="normal" font="default" size="100%">Pfundt, G.</style></author><author><style face="normal" font="default" size="100%">Eyerer, P.</style></author><author><style face="normal" font="default" size="100%">Bernd Jähne</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Oberflächenkonturvermessung mikroskopischer Objekte durch Projektion statistischer Rauschmuster</style></title><secondary-title><style face="normal" font="default" size="100%">Proc. 17. DAGM-Symposium Mustererkennung, Bielefeld, 13.-15. September 1995</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">1995</style></year></dates><pages><style face="normal" font="default" size="100%">319--326</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>