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Publications

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Author Title Type [ Year(Desc)]
Filters: Author is Luc Van Gool  [Clear All Filters]
2002
Spies, H and Garbe, C S (2002). Dense parameter fields from total least squares. Proceedings of the 24th DAGM Symposium on Pattern Recognition. Springer. LNCS 2449 379--386
Garbe, C S, Spies, H and Jähne, B (2002). Mixed OLS-TLS for the estimation of dynamic processes with a linear source term. Proceedings of the 24th DAGM Symposium on Pattern Recognition. Springer-Verlag. 2449 463--471
2003
Eisele, H and Hamprecht, F A (2003). A new approach for defect detection in X-ray CT images. Pattern Recognition. Springer. 2449 345-352PDF icon Technical Report (398.88 KB)