Publications
2008
Szeliski, R, Zabih, R, Scharstein, D, Veksler, O, Kolmogorov, V, Agarwala, A, Tappen, M and Rother, C (2008).
A comparative study of energy minimization methods for Markov random fields with smoothness-based priors.
IEEE Transactions on Pattern Analysis and Machine Intelligence. Springer-Verlag.
30 1068–1080.
http://vision.middlebury.edu/MRF. Szeliski, R, Zabih, R, Scharstein, D, Veksler, O, Kolmogorov, V, Agarwala, A, Tappen, M and Rother, C (2008).
A comparative study of energy minimization methods for Markov random fields with smoothness-based priors.
IEEE Transactions on Pattern Analysis and Machine Intelligence.
30 1068–1080
Torresani, L, Kolmogorov, V and Rother, C (2008).
Feature correspondence via graph matching: Models and global optimization.
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics).
5303 LNCS 596–609
Torresani, L, Kolmogorov, V and Rother, C (2008).
Feature correspondence via graph matching: Models and global optimization.
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics).
5303 LNCS 596–609
Kohli, P, Shekhovtsov, A, Rother, C, Kolmogorov, V and Torr, P (2008).
On partial optimality in multi-label MRFs.
Proceedings of the 25th International Conference on Machine Learning. 480–487
2007
Kolmogorov, V, Boykov, Y and Rother, C (2007).
Applications of parametric maxflow in computer vision.
Proceedings of the IEEE International Conference on Computer Vision Kolmogorov, V, Boykov, Y and Rother, C (2007).
Applications of parametric maxflow in computer vision.
Proceedings of the IEEE International Conference on Computer Vision Kolmogorov, V and Rother, C (2007).
Minimizing nonsubmodular functions with graph cuts - A review.
IEEE Transactions on Pattern Analysis and Machine Intelligence.
29 1274–1279
Rother, C, Kolmogorov, V, Lempitsky, V and Szummer, M (2007).
Optimizing binary MRFs via extended roof duality.
Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition