HCI Logo
Heidelberg University Logo
IWR Logo

Publications

Export 7 results:
Author [ Title(Desc)] Type Year
Filters: Author is Karsten Roth  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
C
T. Milbich, Roth, K., Sinha, S., Schmidt, L., Ghassemi, M., and Ommer, B., “Characterizing Generalization under Out-Of-Distribution Shifts in Deep Metric Learning”. 2021.
D
T. Milbich, Roth, K., Bharadhwaj, H., Sinha, S., Bengio, Y., Ommer, B., and Cohen, J. Paul, “DiVA: Diverse Visual Feature Aggregation for Deep Metric Learning”, IEEE European Conference on Computer Vision (ECCV). 2020.
M
B. Brattoli, Roth, K., and Ommer, B., “MIC: Mining Interclass Characteristics for Improved Metric Learning”, in Proceedings of the Intl. Conf. on Computer Vision (ICCV), 2019.
P
T. Milbich, Roth, K., and Ommer, B., “PADS: Policy-Adapted Sampling for Visual Similarity Learning”, in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2020, vol. 1, no. 1.
R
K. Roth, Milbich, T., Sinha, S., Gupta, P., Ommer, B., and Cohen, J. Paul, “Revisiting Training Strategies and Generalization Performance in Deep Metric Learning”, International Conference on Machine Learning (ICML). 2020.
S
K. Roth, Milbich, T., Ommer, B., Cohen, J. Paul, and Ghassemi, M., “S2SD: Simultaneous Similarity-based Self-Distillation for Deep Metric Learning”, Proceedings of International Conference on Machine Learning (ICML). 2021.
T. Milbich, Roth, K., Brattoli, B., and Ommer, B., “Sharing Matters for Generalization in Deep Metric Learning”, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2020.