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S. Gerloff, Hagemann, A., Schnörr, C., Tieck, S., Stiehl, H. S., Dombrowski, R., Dreyer, M., and Wiesendanger, R., “Semi–Automated Analysis of SXM Images”, in Proc. 9th Int. Conf. on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'97), Hamburg, Germany, 1997.