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Author Title [ Type(Desc)] Year
Filters: Author is Karsten Roth  [Clear All Filters]
Conference Paper
Brattoli, B, Roth, K and Ommer, B (2019). MIC: Mining Interclass Characteristics for Improved Metric Learning. Proceedings of the Intl. Conf. on Computer Vision (ICCV)
Milbich, T, Roth, K and Ommer, B (2020). PADS: Policy-Adapted Sampling for Visual Similarity Learning. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 1.
Journal Article
Milbich, T, Roth, K, Brattoli, B and Ommer, B (2020). Sharing Matters for Generalization in Deep Metric Learning. IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI).