HCI Logo
Heidelberg University Logo
IWR Logo

Publications

Export 7 results:
Author Title [ Type(Desc)] Year
Filters: Author is Karsten Roth  [Clear All Filters]
Conference Paper
B. Brattoli, Roth, K., and Ommer, B., “MIC: Mining Interclass Characteristics for Improved Metric Learning”, in Proceedings of the Intl. Conf. on Computer Vision (ICCV), 2019.
T. Milbich, Roth, K., and Ommer, B., “PADS: Policy-Adapted Sampling for Visual Similarity Learning”, in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2020, vol. 1, no. 1.
Conference Proceedings
T. Milbich, Roth, K., Bharadhwaj, H., Sinha, S., Bengio, Y., Ommer, B., and Cohen, J. Paul, “DiVA: Diverse Visual Feature Aggregation for Deep Metric Learning”, IEEE European Conference on Computer Vision (ECCV). 2020.
K. Roth, Milbich, T., Sinha, S., Gupta, P., Ommer, B., and Cohen, J. Paul, “Revisiting Training Strategies and Generalization Performance in Deep Metric Learning”, International Conference on Machine Learning (ICML). 2020.
K. Roth, Milbich, T., Ommer, B., Cohen, J. Paul, and Ghassemi, M., “S2SD: Simultaneous Similarity-based Self-Distillation for Deep Metric Learning”, Proceedings of International Conference on Machine Learning (ICML). 2021.
inproceedings
T. Milbich, Roth, K., Sinha, S., Schmidt, L., Ghassemi, M., and Ommer, B., “Characterizing Generalization under Out-Of-Distribution Shifts in Deep Metric Learning”. 2021.
Journal Article
T. Milbich, Roth, K., Brattoli, B., and Ommer, B., “Sharing Matters for Generalization in Deep Metric Learning”, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2020.