Publications

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Author Title [ Type(Desc)] Year
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Conference Paper
B. Brattoli, Roth, K., and Ommer, B., MIC: Mining Interclass Characteristics for Improved Metric Learning, in Proceedings of the Intl. Conf. on Computer Vision (ICCV), 2019.
T. Milbich, Roth, K., and Ommer, B., PADS: Policy-Adapted Sampling for Visual Similarity Learning, in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2020, vol. 1, no. 1.
Journal Article
T. Milbich, Roth, K., Brattoli, B., and Ommer, B., Sharing Matters for Generalization in Deep Metric Learning, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2020.