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J. Neumann, Schnörr, C., and Steidl, G., Feasible Adaption Criteria for Hybrid Wavelet – Large Margin Classifiers, in Proc. Computer Analysis of Images and Patterns (CAIP'03), 2003, vol. 2756, pp. 588–595.
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J. Neumann, Schnörr, C., and Steidl, G., SVM-based Feature Selection by Direct Objective Minimisation, in Pattern Recognition, Proc. 26th DAGM Symposium, 2004, vol. 3175, pp. 212-219.