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I
A. Sanakoyeu, Ma, P., Tschernezki, V., and Ommer, B., “Improving Deep Metric Learning by Divide and Conquer”, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2021.
D
A. Sanakoyeu, Tschernezki, V., Büchler, U., and Ommer, B., “Divide and Conquer the Embedding Space for Metric Learning”, Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2019.