Divide and Conquer the Embedding Space for Metric Learning

TitleDivide and Conquer the Embedding Space for Metric Learning
Publication TypeConference Proceedings
Year of Publication2019
AuthorsSanakoyeu, A, Tschernezki, V, Büchler, U, Ommer, B
Conference Name Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Keywordsdeep learning, metric learning
URLhttps://github.com/CompVis/metric-learning-divide-and-conquer
Citation Key6299