| Title | Divide and Conquer the Embedding Space for Metric Learning |
| Publication Type | Conference Proceedings |
| Year of Publication | 2019 |
| Authors | Sanakoyeu, A, Tschernezki, V, Büchler, U, Ommer, B |
| Conference Name | Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) |
| Keywords | deep learning, metric learning |
| URL | https://github.com/CompVis/metric-learning-divide-and-conquer |
| Citation Key | 6299 |
