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Author Title [ Type(Desc)] Year
Filters: Author is Tschernezki, V.  [Clear All Filters]
Conference Proceedings
Sanakoyeu, A, Tschernezki, V, Büchler, U and Ommer, B (2019). Divide and Conquer the Embedding Space for Metric Learning. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
Journal Article
Sanakoyeu, A, Ma, P, Tschernezki, V and Ommer, B (2021). Improving Deep Metric Learning by Divide and Conquer. IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI).