Publications

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Author Title [ Type(Desc)] Year
Filters: Author is Tschernezki, V.  [Clear All Filters]
Conference Proceedings
A. Sanakoyeu, Tschernezki, V., Büchler, U., and Ommer, B., Divide and Conquer the Embedding Space for Metric Learning, Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2019.
Journal Article
A. Sanakoyeu, Ma, P., Tschernezki, V., and Ommer, B., Improving Deep Metric Learning by Divide and Conquer, IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 2021.