Title | Optimal Lighting for Defect Detection: Illumination Systems, Machine Learning, and Practical Verification |
Publication Type | Conference Paper |
Year of Publication | 2010 |
Authors | Jehle, M, Jähne, B |
Editor | F. Leon, P, Heinzmann, M |
Conference Name | Forum Bildverarbeitung, Regensburg, 02.-03.12.2010 |
Publisher | KIT SCientific Publishing |
Citation Key | jehle_10_optimal |