Optimal lighting for defect detection: illumination systems, machine learning, and practical verification

TitleOptimal lighting for defect detection: illumination systems, machine learning, and practical verification
Publication TypeConference Paper
Year of Publication2010
AuthorsJehle, M, Jähne, B
EditorF. Leon, P, Heizmann, M
Conference NameForum Bildverarbeitung
PublisherKIT Scientific Publishing
URLhttp://digbib.ubka.uni-karlsruhe.de/volltexte/1000020266
Citation Keyjehle2010a