| Title | A new approach for defect detection in X-ray CT images |
| Publication Type | In Collection |
| Year of Publication | 2003 |
| Authors | Eisele, H, Hamprecht, FA |
| Editor | Van Gool, L |
| Collection Title | Pattern Recognition |
| Volume | 2449 |
| Pages | 345-352 |
| Publisher | Springer |
| Publication Language | eng |
| DOI | 10.1007/3-540-45783-6 |
| Series | Lecture notes in computer science |
| Citation Key | eisele_03_approach |
