A new approach for defect detection in X-ray CT images

TitleA new approach for defect detection in X-ray CT images
Publication TypeIn Collection
Year of Publication2003
AuthorsEisele, H, Hamprecht, FA
EditorVan Gool, L
Collection TitlePattern Recognition
Volume2449
Pages345-352
PublisherSpringer
Publication Languageeng
DOI10.1007/3-540-45783-6
Series

Lecture notes in computer science

Citation Keyeisele_03_approach